« back to Article

“The High Line Effect” by Jennifer Williams adds a new twist to architectural photography
Jennifer Williams, The High Line Effect: 'Approaching Hudson Yards', 2013. © Jennifer Williams, Courtesy Robert Mann Gallery Jennifer Williams, The High Line Effect: 'Enter at Gansevoort', 2013. © Jennifer Williams, Courtesy Robert Mann Gallery

Jennifer Williams, The High Line Effect: 'Enter at Gansevoort', 2013. © Jennifer Williams, Courtesy Robert Mann Gallery
1

Jennifer Williams, The High Line Effect: "Enter at Gansevoort", 2013. © Jennifer Williams, Courtesy Robert Mann Gallery