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Angstrom Advanced

Angstrom Advanced

Stoughton, MA

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Angstrom Advanced PhE101S Variable Angle Discrete Wavelength Ellipsometer For Solar Cell Application

By nick@angstrom-advanced.co
Sep 21, '16 10:45 AM EST

Angstrom Advanced Model PhE101S is an ideal instrument for antireflective coatings on Silicon Solar Cells. The thickness and optical constants of solar cell or any other antireflective coating’s measurement need unique and advanced technique and configuration because the antireflective coatings, such as Solar Cell has extremely rough surface with very strong absorption. Angstrom Advanced  PhE101S has patented Minsearch technique-which stops the motor at a defined position before the intensity value is measured from the detector. This principle has a significant advantage compared to a system with permanently rotating analyzer because you know the exact rotation position for the measured intensity value.