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“The High Line Effect” by Jennifer Williams adds a new twist to architectural photography
Jennifer Williams, The High Line Effect: 'Approaching Hudson Yards', 2013. © Jennifer Williams, Courtesy Robert Mann Gallery Jennifer Williams, The High Line Effect: 'Enter at Gansevoort', 2013. © Jennifer Williams, Courtesy Robert Mann Gallery

Jennifer Williams, The High Line Effect: 'Approaching Hudson Yards', 2013. © Jennifer Williams, Courtesy Robert Mann Gallery
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Jennifer Williams, The High Line Effect: "Approaching Hudson Yards", 2013. © Jennifer Williams, Courtesy Robert Mann Gallery